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    当前位置:通用仪器(二手) > 示波器 > 1GHz以上示波器

    LeCroy/D300A-AT/D300A-AT

    • LeCroy/D300A-AT/D300A-AT
    • 欲购买或租赁LeCroy/D300A-AT/D300A-AT?请在线咨询或拔打24小时电话:13715327187
    D300A-AT/LeCroy缩略图

    详细资料:

    D300A-AT 4.0G的带宽
     
    Exceptional Waveform Fidelity

    WaveLink® probes provide industry leading technology for wideband signal connection to test instruments. The first differential probes to employ SiGe technology, they deliver full system bandwidth when used with WaveRunner®, WavePro®, WaveMaster®, DDA and SDA oscilloscopes up to 6 GHz.

    WaveLink probes:
    • Use transmission line topology in the input section combined with active differential probe technology
    • Maintain good loading characterisitcs across the frequency span

    Very Accurate Eye Pattern Measurements
    WaveLink probes virtually eliminate distortion when measuring signals. This benefit is particularly useful in eye pattern measurements, now routine for systems using fast serial parallel data bus architecture.All WaveLink probes offer:
    • Superior loading characteristics
    • Precise frequency response with outstanding fidelity for high-speed signals
    • Both low loading and frequency response flatness are needed to ensure the signal fidelity required to measure performance accurately.

    D500PT Positioner Mounted Probe Tip Module
    The probe has a very thin form factor, allowing multiple probes to be used when several channels are required to monitor signals from the same small IC. It has 2 mm of Z-axis compliance through spring-loaded telescoping tips, allowing considerable angular freedom relative to the circuit board while still maintaining reliable contact with both inputs. A ball joint between the tip and mounting arm makes it even easier to adjust for placement when already mounted in a positioner. A small thumbscrew allows precise and secure adjustment of the tip spacing.

    The Positioner Mounted Module, D500PT, can be used as a browser in a positioner such as Easy Probe. Because of its thin form factor and spring-loaded tips, it is ideally suited for use with multiple probes in tight areas, such as the back side of boards with ball-grid array packaged ICs.

    仪器保证:

    我们的大多数设备在装运之前均经过严格的质量检测与校验。也可申请国家计量证书。

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